Fu-chien Chiu : rechercher sur Z-Library

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1

[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - A SCR-buried BJT device for robust ESD protection with high latchup immunity in high-voltage technology

Huang, Chih-Yao, Quo-Ker Chen,, Ming-Fang Lai,, Chiu, Fu-Chien, Tseng, Jen-Chou

Année:

2009

Langue:

english

Fichier:

PDF, 4.92 MB

english, 2009

2

[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Anomalous latchup failure induced by on-chip ESD protection circuit in a high-voltage CMOS IC product

I-Cheng Lin,, Chih-Yao Huang,, Chuan-Jane Chao,, Ming-Dou Ker,, Sung-Yu Chuan,, Len-Yi Leu,, Fu-Chien Chiu,, Jen-Chou Tseng,

Année:

2002

Langue:

english

Fichier:

PDF, 814 KB

english, 2002

3

Design optimization of ESD protection and latchup prevention for a serial I/O IC

Chih-Yao Huang, Wei-Fang Chen, Song-Yu Chuan, Fu-Chien Chiu, Jeng-Chou Tseng, I-Cheng Lin, Chuan-Jane Chao, Len-Yi Leu, Ming-Dou Ker

Journal:

Microelectronics Reliability

Année:

2004

Langue:

english

Fichier:

PDF, 443 KB

english, 2004

4

Electrical properties of metal–HfO2–silicon system measured from metal–insulator–semiconductor capacitors and metal–insulator–semiconductor field–effect transistors using HfO2 gate dielectric

Fu-Chien Chiu, Shun-An Lin, Joseph Ya-min Lee

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 245 KB

english, 2005

5

[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - A high latchup - Immune ESD protection SCR-incorporated BJT in deep submicron technology

Chih-Yao Huang,, Fu-Chien Chiu,, Ji-Fan Chi,, Yi-Jou Huang,, Quo-Ker Chen,, Jen-Chou Tseng,

Année:

2013

Fichier:

PDF, 768 KB

2013

6

An SCR-Incorporated BJT Device for Robust ESD Protection With High Latchup Immunity in High-Voltage Technology

Huang, Chih-Yao, Chiu, Fu-Chien, Chen, Quo-Ker, Lai, Ming-Fang, Tseng, Jen-Chou

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 1.19 MB

english, 2012

7

[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Reliability characteristics of cerium dioxide thin films

Chiu, Fu-Chien, Shu-Hao Chang,, Chih-Yao Huang,

Année:

2011

Langue:

english

Fichier:

PDF, 407 KB

english, 2011

8

Electrical analyses of charge trapping and stress-induced leakage current in CeO 2 gate dielectric

Chiu, Fu-Chien, Chang, Shu-Hao

Journal:

Journal of the Chinese Institute of Engineers

Année:

2014

Langue:

english

Fichier:

PDF, 393 KB

english, 2014

9

An investigation of surface state capture cross-sections for metal–oxide–semiconductor field-effect transistors using HfO2 gate dielectrics

Fu-Chien Chiu, Wen-Chieh Shih, Joseph Ya-min Lee, Huey-Liang Hwang

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 289 KB

english, 2007

10

Structural and electrical properties of thin Ho2O3 gate dielectrics

Tung-Ming Pan, Wei-Tsung Chang, Fu-Chien Chiu

Journal:

Thin Solid Films

Année:

2010

Langue:

english

Fichier:

PDF, 1.15 MB

english, 2010

11

[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Conduction mechanisms and reliability characteristics in MgO resistive switching memory devices

Fu-Chien Chiu,, Jun-Jea Feng,, Wen-Chieh Shih,, Po-Yueh Cheng,, Chih-Yao Huang,

Année:

2011

Langue:

english

Fichier:

PDF, 267 KB

english, 2011

12

Reliability properties of metal-oxide-semiconductor capacitors using HfO[sub 2] high-κ dielectric

Chen, Chun-Heng, Chang, Ingram Yin-Ku, Lee, Joseph Ya-Min, Chiu, Fu-Chien, Chiouand, Yan-Kai, Wu, Tai-Bor

Journal:

Applied Physics Letters

Année:

2007

Langue:

english

Fichier:

PDF, 327 KB

english, 2007

13

[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Reliability characterizations of resistive switching devices using zinc oxide thin film

Fu-Chien Chiu,, Peng-Wei Li,, Chang, Wen-Yuan, Wu, Tai-Bor, Chen, Chih-Chi, Chih-Yao Huang,

Année:

2011

Langue:

english

Fichier:

PDF, 484 KB

english, 2011

14

Thin Film Applications in Advanced Electron Devices

Chiu, Fu-Chien, Pan, Tung-Ming, Kundu, Tapas Kumar, Shih, Chun-Hsing

Journal:

Advances in Materials Science and Engineering

Année:

2014

Langue:

english

Fichier:

PDF, 79 KB

english, 2014

15

ECS Transactions [ECS 217th ECS Meeting - Vancouver, Canada (April 25 - April 30, 2010)] - CeO

Shih, Wen-chieh, Chen, Chun-Heng, Chiu, Fu-Chien, Lai, Chih-Ming, Hwang, Huey-Liang

Année:

2010

Langue:

english

Fichier:

PDF, 575 KB

english, 2010

16

[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Inserted substrate pickup style with external resistance in an ESD NMOS transistor

Huang, Chih-Yao, Chiu, Fu-Chien, Lin, Bo-Chen, Song, Po-Kung

Année:

2017

Langue:

english

Fichier:

PDF, 355 KB

english, 2017

17

Structural properties and electrical characteristics of high-k Dy2O3 gate dielectrics

Tung-Ming Pan, Wei-Tsung Chang, Fu-Chien Chiu

Journal:

Applied Surface Science

Année:

2011

Langue:

english

Fichier:

PDF, 717 KB

english, 2011

18

Advance in next Century nanoCMOSFET research

Huey-Liang Hwang, Yan-Kai Chiou, Che-Hao Chang, Chen-Chan Wang, Kun-Yu Lee, Tai-Bor Wu, Raynien Kwo, Minghwei Hong, Kuei-Shu Chang-Liao, Chun-Yuan Lu, Chun-Chang Lu, Fu-Chien Chiu, Chun-Heng Chen, Jos

Journal:

Applied Surface Science

Année:

2007

Langue:

english

Fichier:

PDF, 993 KB

english, 2007

19

The electrical properties of Metal–Ferroelectric (PbZr0.53Ti0.47O3)–Insulator–Silicon (MFIS) capacitors with different insulator materials

Pi-chun Juan, Yu-ping Hu, Fu-chien Chiu, Joseph Ya-min Lee

Journal:

Microelectronic Engineering

Année:

2005

Langue:

english

Fichier:

PDF, 330 KB

english, 2005

20

Thickness and Temperature Dependence of Dielectric Reliability Characteristics in Cerium Dioxide Thin Film

Journal:

IEEE Transactions on Electron Devices

Année:

2010

Langue:

english

Fichier:

PDF, 645 KB

english, 2010

21

Metal–Oxide–High- -Oxide–Silicon Memory Device Using a Ti-Doped Charge-Trapping Layer and Blocking Layer

Fa-Hsyang Chen, Tung-Ming Pan, Fu-Chien Chiu

Journal:

IEEE Transactions on Electron Devices

Année:

2011

Langue:

english

Fichier:

PDF, 595 KB

english, 2011

22

Reliability characteristics and conduction mechanisms in resistive switching memory devices using ZnO thin films

Fu-Chien Chiu, Peng-Wei Li, Wen-Yuan Chang

Journal:

Nanoscale Research Letters

Année:

2012

Langue:

english

Fichier:

PDF, 1.43 MB

english, 2012

23

Electrical characterization and current transportation in metalâDy[sub 2]O[sub 3]âSi structure

Journal:

Journal of Applied Physics

Année:

2007

Langue:

english

Fichier:

PDF, 762 KB

english, 2007

24

Optical and electrical characterizations of cerium oxide thin films

Chiu, Fu-Chien, Lai, Chih-Ming

Journal:

Journal of Physics D Applied Physics

Année:

2010

Langue:

english

Fichier:

PDF, 164 KB

english, 2010

25

Current Conduction Mechanisms in CeO[sub 2] Thin Films

Journal:

Electrochemical and Solid-State Letters

Année:

2008

Langue:

english

Fichier:

PDF, 528 KB

english, 2008

26

Conduction mechanism of resistive switching films in MgO memory devices

Chiu, Fu-Chien, Shih, Wen-Chieh, Feng, Jun-Jea

Journal:

Journal of Applied Physics

Année:

2012

Langue:

english

Fichier:

PDF, 566 KB

english, 2012

27

Current conduction mechanisms in Pr[sub 2]O[sub 3]/oxynitride laminated gate dielectrics

Chiu, Fu-Chien, Lee, Chun-Yen, Pan, Tung-Ming

Journal:

Journal of Applied Physics

Année:

2009

Langue:

english

Fichier:

PDF, 533 KB

english, 2009

28

Electrical Characterization of $\hbox{ZrO}_{2}/\hbox{Si}$ Interface Properties in MOSFETs With $\hbox{ZrO}_{2}$ Gate Dielectrics

Liu, Chuan-Hsi, Chiu, Fu-Chien

Journal:

IEEE Electron Device Letters

Année:

2007

Langue:

english

Fichier:

PDF, 290 KB

english, 2007

29

[IEEE 2013 IEEE International Nanoelectronics Conference (INEC) - Singapore, Singapore (2013.01.2-2013.01.4)] 2013 IEEE 5th International Nanoelectronics Conference (INEC) - Trap exploration of ZnO-based resistance switching memory devices

Chiu, Fu-Chien, Chang, Wen-Yuan, Li, Peng-Wei, Chen, Chih-Chi, Chiang, Wen-Ping

Année:

2013

Langue:

english

Fichier:

PDF, 196 KB

english, 2013

30

[IEEE 2014 Tenth International Vacuum Electron Sources Conference (IVESC) - Saint-Petersburg, Russia (2014.6.30-2014.7.4)] 2014 Tenth International Vacuum Electron Sources Conference (IVESC) - Structural properties and electrical characteristics of high-k GdTiO3 gate dielectrics for InGaZnO thin-film transistors

Chen, Ching-Hung, Her, Jim-Long, Pan, Tung-Ming, Chiu, Fu-Chien, Koyama, Keiichi

Année:

2014

Langue:

english

Fichier:

PDF, 149 KB

english, 2014

31

Leakage currents in amorphous Ta[sub 2]O[sub 5] thin films

Chiu, Fu-Chien, Wang, Jenn-Jyh, Lee, Joseph Ya-min, Wu, Shich Chuan

Journal:

Journal of Applied Physics

Année:

1997

Langue:

english

Fichier:

PDF, 420 KB

english, 1997

32

Electrical conduction mechanisms of metal∕La[sub 2]O[sub 3]∕Si structure

Chiu, Fu-Chien, Chou, Hong-Wen, Lee, Joseph Ya-min

Journal:

Journal of Applied Physics

Année:

2005

Langue:

english

Fichier:

PDF, 417 KB

english, 2005

33

Analysis of breakdown characteristics in high-k dielectrics under electrostatic discharge impulse stress

Chen, Chun-Heng, Liao, Ming Han, Chiu, Fu-Chien, Hwang, Huey-Liang

Journal:

Journal of Applied Physics

Année:

2010

Langue:

english

Fichier:

PDF, 572 KB

english, 2010

34

Electrical characterization of tunnel insulator in metal/insulator tunnel transistors fabricated by atomic force microscope

Chiu, Fu-Chien, Fan, Shih-Kai, Tai, Kwang-Cheng, Lee, Joseph Ya-min, Chou, Ya-Chang

Journal:

Applied Physics Letters

Année:

2005

Langue:

english

Fichier:

PDF, 627 KB

english, 2005

35

Reliability characterization of stress-induced charge trapping in HfO[sub 2] by electrostatic discharge impulse stresses

Chen, Chun-Heng, Hwang, Huey-Liang, Chiu, Fu-Chien

Journal:

Journal of Applied Physics

Année:

2009

Langue:

english

Fichier:

PDF, 396 KB

english, 2009

36

The charge trapping effect of metal-ferroelectric (PbZr[sub 0.53]Ti[sub 0.47]O[sub 3])-insulator (HfO[sub 2])-silicon capacitors

Juan, Pi-chun, Hu, Yu-ping, Chiu, Fu-chien, Lee, Joseph Ya-min

Journal:

Journal of Applied Physics

Année:

2005

Langue:

english

Fichier:

PDF, 383 KB

english, 2005

37

[IEEE 2014 Tenth International Vacuum Electron Sources Conference (IVESC) - Saint-Petersburg, Russia (2014.6.30-2014.7.4)] 2014 Tenth International Vacuum Electron Sources Conference (IVESC) - Effect of titanium content on the impedance characteristics of high-Κ TbTxOy electrolyte-insulator-semiconductor pH sensors

Wang, Chih-Wei, Pan, Tung-Ming, Chiu, Fu-Chien, Chi, Lifeng

Année:

2014

Langue:

english

Fichier:

PDF, 154 KB

english, 2014

38

Polarity of Bipolar Resistive Switching Characteristics in ZnO Memory Films

Chang, Wen-Yuan, Peng, Ching-Shiang, Lin, Cheng-Hung, Tsai, Jui-Ming, Chiu, Fu-Chien, Chueh, Yu-Lun

Journal:

Journal of The Electrochemical Society

Année:

2011

Langue:

english

Fichier:

PDF, 1.73 MB

english, 2011

39

ECS Transactions [ECS 217th ECS Meeting - Vancouver, Canada (April 25 - April 30, 2010)] - Reliability Characteristics of D

Tu, Chia-Hao, Chiu, Fu-Chien, Chen, Chun-Heng, Hou, Cheng-Hao, Lee, Zi-Jay, Chen, Hung-Wen, Chen, Shuang-Yuan, Huang, Heng-Sheng, Wu, Tai-Bor, Hwang, Huey-Liang

Année:

2010

Langue:

english

Fichier:

PDF, 418 KB

english, 2010

40

Interfacial and Electrical Characterization in Metal–Oxide–Semiconductor Field-Effect Transistors with CeO 2 Gate Dielectric

Chiu, Fu-Chien, Chen, Shuang-Yuan, Chen, Chun-Heng, Chen, Hung-Wen, Huang, Heng-Sheng, Hwang, Huey-Liang

Journal:

Japanese Journal of Applied Physics

Année:

2009

Langue:

english

Fichier:

PDF, 501 KB

english, 2009

41

ECS Transactions [ECS 217th ECS Meeting - Vancouver, Canada (April 25 - April 30, 2010)] - New Metal-High-k-High-k-Oxide-Semiconductor Capacitors and Field Effect Transistors Using Al/Y

Shih, Wen-chieh, Chiu, Fu-Chien, Hwang, Huey-Liang

Année:

2010

Langue:

english

Fichier:

PDF, 436 KB

english, 2010

42

Surface State Capture Cross-Section at the Interface between Silicon and Hafnium Oxide

Journal:

Advances in Materials Science and Engineering

Année:

2013

Langue:

english

Fichier:

PDF, 423 KB

english, 2013

43

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - Stress-Induced Leakage Current and Charge Trapping in Cerium Dioxide Thin Film

Chiu, Fu-Chien, Chang, S. H.

Année:

2010

Langue:

english

Fichier:

PDF, 274 KB

english, 2010

44

Resistance Switching Characteristics in ZnO-Based Nonvolatile Memory Devices

Journal:

Advances in Materials Science and Engineering

Année:

2013

Langue:

english

Fichier:

PDF, 717 KB

english, 2013

45

Charge-Trapping Devices Using Multilayered Dielectrics for Nonvolatile Memory Applications

Shih, Wen-Chieh, Cheng, Chih-Hao, Lee, Joseph Ya-min, Chiu, Fu-Chien

Journal:

Advances in Materials Science and Engineering

Année:

2013

Langue:

english

Fichier:

PDF, 246 KB

english, 2013

46

A Substrate-and-Gate Triggering NMOS Device for High ESD Reliability in Deep Submicrometer Technology

Huang, Chih-Yao, Chiu, Fu-Chien

Journal:

Advances in Materials Science and Engineering

Année:

2013

Langue:

english

Fichier:

PDF, 1.00 MB

english, 2013

47

A Review on Conduction Mechanisms in Dielectric Films

Journal:

Advances in Materials Science and Engineering

Année:

2014

Langue:

english

Fichier:

PDF, 1.67 MB

english, 2014

48

ECS Transactions [ECS 217th ECS Meeting - Vancouver, Canada (April 25 - April 30, 2010)] - Temperature and Thickness Dependence of Cerium Oxide Dielectric Breakdown

Chen, Chun-Heng, Shih, Wen-chieh, Huang, Huey-Liang, Chiu, Fu-Chien

Année:

2010

Langue:

english

Fichier:

PDF, 337 KB

english, 2010

49

Conduction Mechanisms in Resistance Switching Memory Devices Using Transparent Boron Doped Zinc Oxide Films

Journal:

Année:

2014

Langue:

english

Fichier:

PDF, 719 KB

english, 2014

50

Trap characterization and conductance quantization in phosphorus-doped ZnO memory devices

Chiu, Fu-Chien, Yang, Min-Yu

Journal:

Année:

2017

Langue:

english

Fichier:

PDF, 710 KB

english, 2017